AT&T Reliability Manual - Yoshinao Nakada,Maria A Menendez,David J Klinger
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Saadetis 22-28 tööpäeva jooksul
30-päevane tagastamisõigus
Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.
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Kirjeldus
Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.
Lisateave
| Autor | Yoshinao Nakada, Maria A Menendez, David J Klinger |
|---|---|
| Kirjastaja | Springer Us |
| Väljalaskeaasta | 1999 |
| Kaanetüüp | Kõvakaaneline |
| EAN | 9780442318482 |