Tasuta kohaletoimetamine tellimustele üle 29 €
  • check 10+ miljonit raamatut
  • check Uued tooted iga päev
  • check Meid usaldab üle 1 miljoni kliendi
  • check Hea hind ja allahindlused
  • check Tarne üle kogu Euroopa

Atom Probe Tomography: Analysis at the Atomic Level - Michael K. Miller

inglise keel
2000-07-31
166,31 € 277,18 €

-40% koodiga BOOKS

Meie tarnija laos

Saadetis 17-23 tööpäeva jooksul

30-päevane tagastamisõigus

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three­ dimensional images of the solute distribution within the microstructures of materials. This monograph is de ... Täielik kirjeldus

Võib-olla meeldib sulle ka

Kirjeldus

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three­ dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three­ dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Lisateave

Autor Michael K. Miller
Kirjastaja Springer US
Väljalaskeaasta 2000
Kaanetüüp Kõvakaaneline
EAN 9780306464157
Kirjuta oma arvustus
Te vaatate: Atom Probe Tomography: Analysis at the Atomic Level
Teie hinnang:

Goodreads'i arvustused

166,31 € 277,18 €