Digital Hardware Testing: Transistor-Level Fault Modeling and Testing -
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Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.
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Kirjeldus
Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.
Lisateave
| Kirjastaja | Artech House Publishers |
|---|---|
| Series | Artech House Telecommunication |
| Väljalaskeaasta | 1992 |
| Kaanetüüp | Kõvakaaneline |
| EAN | 9780890065808 |