Tasuta kohaletoimetamine tellimustele üle 29 €
  • check 10+ miljonit raamatut
  • check Uued tooted iga päev
  • check Meid usaldab üle 1 miljoni kliendi
  • check Hea hind ja allahindlused
  • check Tarne üle kogu Euroopa

Electromigration: Studied with the Optical Microscopy Imaging Method - Linghong Li

inglise keel
2008-10-10
54,78 € 91,30 €

-40% koodiga BOOKS

Meie tarnija laos

Saadetis 10-16 tööpäeva jooksul

30-päevane tagastamisõigus

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose ... Täielik kirjeldus

Võib-olla meeldib sulle ka

Kirjeldus

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only provides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non- contact mode.

Lisateave

Autor Linghong Li
Kirjastaja VDM Verlag
Väljalaskeaasta 2008
Kaanetüüp Pehme kaanega
EAN 9783639088137
Kirjuta oma arvustus
Te vaatate: Electromigration: Studied with the Optical Microscopy Imaging Method
Teie hinnang:

Goodreads'i arvustused

54,78 € 91,30 €