(Ipf)Microelectronic Reliability - Edward B Hakim
-25% koodiga BOOKS
Saadetis 22-28 tööpäeva jooksul
30-päevane tagastamisõigus
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Kirjeldus
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Lisateave
| Autor | Edward B Hakim |
|---|---|
| Kirjastaja | Artech House Publishers |
| Väljalaskeaasta | 1989 |
| Kaanetüüp | Kõvakaaneline |
| EAN | 9780890062845 |