The overall aim of the book is to extend recent concepts, methodologies, and empirical research advances of various machine vision inspection systems through image processing approaches in various applications such as industry, medical and space research.

Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes the image processing, machine vision and pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Recently, the current automated vision research on machine inspection has gained more popularity with researchers and engineers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examinations during the inspection process, leading to potential disaster. Machine Vision Inspection Systems (MVIS) is better able to avoid false assessment. The book brings together leading academic and industry researchers and scientists to share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also presents and discusses the most recent innovations, trends, methodology, applications, and concerns as well as practical challenges encountered and solutions adopted in the inspection system in terms of image processing and analytics of machine vision for real and industrial application.

Audience
The book will have much interest in the industrial engineering manufacturing sector, especially the non-destructive testing industries such as defence, aerospace, remote sensing, defect/fault inspection specialists, medical diagnosis labs and instrument makers. Industry engineers and as well researchers in computer science associated with image processing, machine vision and pattern recognition, artificial intelligence, data analytics, will find this book valuable.