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Noncontact Atomic Force Microscopy: Volume 2 -

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2012-03-14
243,92 € 406,54 €

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic ... Täielik kirjeldus

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Kirjeldus

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Lisateave

Kirjastaja Springer Berlin Heidelberg
Series NanoScience and Technology
Väljalaskeaasta 2012
Kaanetüüp Pehme kaanega
EAN 9783642260704
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Te vaatate: Noncontact Atomic Force Microscopy: Volume 2
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243,92 € 406,54 €