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RADIATION EFFECTS & SOFT ERRORS ...(V34) - Schrimpf R D

inglise keel
2004-07-29
159,04 € 265,06 €

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconducto ... Täielik kirjeldus

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Kirjeldus

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Lisateave

Autor Schrimpf R D
Kirjastaja World Scientific
Väljalaskeaasta 2004
Kaanetüüp Kõvakaaneline
EAN 9789812389404
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159,04 € 265,06 €