Stepped Waveguide Electromagnetic Material Characterization Technique - Sean P. Dorey
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Saadetis 10-16 tööpäeva jooksul
30-päevane tagastamisõigus
Electromagnetic material characterization is the process of determining the complex permittivity and permeability of a material. A new waveguide material measurement technique is developed to reduce test sample size requirements for low-frequency applications. Specifically, a waveguide sample holder having a reduced aperture is utilized to decrease the time and cost spent producing large precision test samp ... Täielik kirjeldus
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Kirjeldus
Electromagnetic material characterization is the process of determining the complex permittivity and permeability of a material. A new waveguide material measurement technique is developed to reduce test sample size requirements for low-frequency applications. Specifically, a waveguide sample holder having a reduced aperture is utilized to decrease the time and cost spent producing large precision test samples. This type of sample holder causes a disruption in the waveguide-wall surface currents that results in the excitation of higher-order modes. This thesis will demonstrate how these higher-order modes can be accommodated using a modal-analysis technique, thus resulting in the ability to measure smaller samples mounted in large waveguides and still determine the constitutive parameters of the materials at the desired frequencies.
Lisateave
| Autor | Sean P. Dorey |
|---|---|
| Kirjastaja | Creative Media Partners, LLC |
| Väljalaskeaasta | 2012 |
| Kaanetüüp | Pehme kaanega |
| EAN | 9781288319060 |