Thin Films and its Characterisation - M. K. Totlani,K. Baba Pai,Jyoti Menghani
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Saadetis 15-21 tööpäeva jooksul
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The book deals with the importance of surface engineering followed by thin film deposition and its characterisation.The comparison of most commonly used PVD and CVD technique.The thin films are then characterised in terms of corrosion resistance (potentiodynamic and Electrochemical Impedance Spectroscopy)and Wear Testing (Pin on Disc) detailed information about the behaviour of material under various enviro ... Täielik kirjeldus
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Kirjeldus
The book deals with the importance of surface engineering followed by thin film deposition and its characterisation.The comparison of most commonly used PVD and CVD technique.The thin films are then characterised in terms of corrosion resistance (potentiodynamic and Electrochemical Impedance Spectroscopy)and Wear Testing (Pin on Disc) detailed information about the behaviour of material under various environmental condition is described in detail.
Lisateave
| Autor | M. K. Totlani, K. Baba Pai, Jyoti Menghani |
|---|---|
| Kirjastaja | LAP LAMBERT Academic Publishing |
| Väljalaskeaasta | 2018 |
| Kaanetüüp | Pehme kaanega |
| EAN | 9786138007067 |