Raamatud Jose Pineda
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda de Gyvez, Manoj Sachdev
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda de Gyvez, Manoj Sachdev
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Amir Zjajo, José Pineda de Gyvez
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
-30% koodiga BOOKS
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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
Amir Zjajo, José Pineda de Gyvez
-30% koodiga BOOKS
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