Raamatud Laung-Terng Wang
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VLSI Test Principles and Architectures: Design for Testability
Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
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System-On-Chip Test Architectures: Nanometer Design for Testability Volume .
Charles E Stroud, Laung-Terng Wang, Nur A Touba
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VLSI Test Principles and Architectures: Design for Testability
Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
113,60 €
162,29 €
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