Raamatud Yi Chai

Data-Driven Fault Diagnosis for Complex Industrial Processes: Towards Fault Prediction, Detection and Identification

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Intelligent Testing, Control and Decision-Making for Space Launch

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Advances in Swarm Intelligence, Part I Second International Conference, ICSI 2011, Chongqing, China, June 12-15, 2011, Proceedings

Ying Tan, Yuhui Shi, Yi Chai, Guoyin Wang

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