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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Ben Kaczer, Guido Groeseneken, Jacopo Franco
127,04 €
169,38 €
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-25%
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Ben Kaczer, Guido Groeseneken, Jacopo Franco
127,04 €
169,38 €
-25% koodiga BOOKS
Meie tarnija laos