Raamatud Guido Groeseneken
ESD Protection Challenges: FinFET Technology and RF CMOS Circuits
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Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Ben Kaczer, Guido Groeseneken, Jacopo Franco
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Ben Kaczer, Guido Groeseneken, Jacopo Franco
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