Raamatud Cher Ming Tan
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
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Electromigration Modeling at Circuit Layout Level
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
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Graphene and VLSI Interconnects
Vivek Sangwan, Udit Narula, Cher-Ming Tan
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Reliability and Failure Analysis of High-Power LED Packaging
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