Raamatud Zhenghao Gan
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
118,57 €
169,38 €
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Yuejin Hou, Wei Li, Cher Ming Tan, Zhenghao Gan
118,57 €
169,38 €
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Semiconductor Process Reliability in Practice
Waisum Wong, Zhenghao Gan, Juin J. Liou
197,02 €
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